Touch-operated vector network analyser
Rohde & Schwarz’s ZNA high-end vector network analyser, a powerful universal platform for characterising active and passive devices under test (DUT), offers a unique hardware concept that simplifies measurement configuration. Its excellent measurement stability and trace noise enable users to perform demanding measurements on active and passive components and modules. Thanks to its innovative, DUT-centric approach, the world’s first purely touch-operated vector network analyser reduces configuration times to a minimum.
The two models ZNA26 (10MHz-26.5GHz) and ZNA43 (10MHz-43.5GHz) offer a dynamic range of 146 dB (typ.) and a trace noise as low as 0.001 dB at 1 kHz IF bandwidth. These two features are essential for measurements on high-rejection filters. With its unique hardware concept, the ZNA can perform mixer measurements for RF and IF in parallel, delivering measurement speed twice as fast as with a conventional approach. Amplifier characterisation becomes easy with a 100 dB power sweep range, a pulse generator and modulator per test port, versatile intermodulation measurement capabilities and spectrum analyser functionality.
The ZNA offers four internal, phase-coherent sources, eight truly parallel receivers and two internal local oscillators (LO). This simplifies test setups for characterising frequency-converting devices, amplifiers and even complex T/R modules, requiring the DUT to be connected only once. Users can perform vector-corrected conversion loss, phase and group delay measurements in half the time required with conventional approaches and without the need for a reference mixer.
The ZNA offers a unique approach, focused on the DUT, to simplify measurement configuration. The user first selects the type of DUT (e.g. mixer or amplifier) and is then guided step-by-step through configuration to the desired test setup. This solution significantly speeds up and facilitates test setups. Alternatively, users can take the conventional approach and configure measurements individually, providing high flexibility to master even the most challenging measurement tasks.